AFM/Raman – Tip Enhanced Raman Scattering (TERS)

HORIBA’s leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and thermal conductivity, temperature and piezo response (among many others), near-field optical techniques (SNOM or NSOM), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy. The end result is a more comprehensive sample characterization in one versatile instrument, for fast simultaneous co-localized measurements and Tip-Enhanced Raman Spectroscopy (TERS)..

Tip-Enhanced Raman (TERS): chemical imaging at the nanoscale

TERS brings you the best of both worlds: the chemical specificity of Raman spectroscopy with imaging at spatial resolution typically down to 10nm. This technique can be demonstrated on various samples ranging from 1D and 2D nanomaterials to DNA.

AFM-Raman and nano-Raman (TERS)
Tip-Enhanced Raman (TERS) image of a graphene oxide flake and several carbon nanotubes chemically resolved down to 15nm.

Not just TERS: high-speed TERS imaging!

HORIBA Scientific does not only provide TERS capable systems, nor do we only guaranty TERS enhancement when measuring at a single point. HORIBA Scientific is the first equipment manufacturer to guarantee TERS imaging capability and nano-resolution thanks to our STM-TERS tips, AFM-TERS tipsand test samples.

Raman-AFM: High-speed, simultaneous SPM and spectroscopy

AFM-Raman topographyAFM-Raman topographyAFM-Raman composite Raman imageAFM-Raman single layer grapheneAFM-Raman phase imageAFM-Raman 2 layers grapheneAFM-Raman capacitanceAFM-Raman 3 layers grapheneAFM-Raman Contact Potential Difference KPFMAFM-Raman defects in grapheneAFM-Raman friction imageAFM-Raman optical image
Co-localized AFM and Raman images of 1 layer, 2 layers and 3 layers graphene
  • AFM and other SPM techniques like STM, shear force or NSOM, provide topographic, mechanical, thermal, electrical, and magnetic properties with molecular resolution.
  • Confocal Raman spectroscopy and imaging provides specific chemical information about your nano-materials, with sub-micron spatial resolution.
  • A unique platform for simultaneous measurements helps you spend more time getting results with the confidence the images you get are truly correlated.
  • Combining high performance with ease of use, HORIBA offers a reliable and full-featured solution.